BSPIO, JTAG Modules

A set of low cost Boundary scan parallel I/O JTAG Technologies compatible

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Brief description about Simplex4 BSPIO Carrier

Boundary Scan Parallel I/O Carrier

Simplex4, low cost bscan hardware, top viewThe CARRIER4 is the ideal low cost solution for the creation of fixtures for BSCAN (JTAG) tests of low-to-midrange complexity electronic boards. CARRIER4 can control up to 312 independent I/Os, it can be equipped with BSPIO modules that allow both standard TTL digital connections and interfaces, multivoltage electrical levels such as RS232, RS485, LVDS, Current loop and discrete high voltage (15-28V).

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Brief description about BSPIO-TTL78U

JTAG Parallel TTL I/O Module

BSCAN (JTAG) TTL parallel I/O ModuleThe BSPIO-78TTLU provides bi-directional parallel-scan access to up to 78 TTL, 5Volt tollerant, electrical nodes for the driving and sensing of logic values. This module increases the effectiveness of boundary-scan testing, enabling verification of all board connectors and within logic clusters. This module facilitates boundary-scan interconnection testing using connection to the JTAG/IEEE 1149.1 Test Access Port (TAP).

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Brief description about BSPIO-STDIF1688

LVDS, RS485, RSD232 BSCAN Parallel I/O

BSCAN (JTAG) Multi Standard parallel I/O ModuleThe BSPIO-STDIF1688 provides bi-directional parallel-scan access to up to 40 electrical nodes with various distinct interfaces for the driving and sensing of logic values. All  I/O interfaces (16xRS485/RS422, 8xLVDS) have an internal loopback for self test capability, while input only and output only interfaces (8xRS232) are cross connected via a weak resistor to ensure the self test capability.

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Brief description about BSPIO-LVDS39

39 LVDS channels Boundary Scan I/O

BSCAN (JTAG) LVDS Parallel I/OThe BSPIO-LVDS39 provides bi-directional parallel-scan access to up to 39 electrical nodes with LVDS interfaces for the driving and sensing of logic values. This module increases the effectiveness of boundary-scan testing, enabling verification of all board connectors and within logic clusters. All BSPIO I/O LVDS interfaces have an internal loopback allowing self test capability.

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Brief description about BSPIO-RELE5

JTAG Rele and MUX-DEMUX module

JTAG Rele and MUX-DEMUX moduleThe BSPIO-RELE5 provides parallel-scan controlled access to up to 20 electrical analog nodes for driving analog signal inputs or sensing analog signal outputs. This module adds to the JTAG fixtures the capability of analog tests and measurements integrated with the UUT boundary-scan or traditional control logic.

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Brief description about BSPIO-OPTO1212

JTAG opto coupled parallel I/O module

JTAG opto coupled parallel I/O module

The BSPIO-OPTO1212 provides parallel-scan controlled access to up to 24 optically isolated electrical lines for driving up to 12 signal inputs or sensing up to 12 signal outputs. The output cell has 3 terminals on the output transistor, is protected from overcurrent and provides feedback for the self test. The input cell has 3 terminals on the input diode, is protected from overcurrent and has an integrated driver for the self test.

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Brief description about BSPIO-DIO888

JTAG discrete (High Voltage) parallel I/O module

JTAG discrete (High Voltage) parallel I/O moduleThe BSPIO-DIO888 provides bi-directional parallel-scan access to up to 40 electrical I/O nodes, 24 with high voltage level and 16 nodes with standard TTL level, for the driving and sensing of logic values.All BSPIO I/O interfaces have an internal loopback to ensure the self test capability.

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